The purpose of the discipline is to acquaint students with the basics of metrology, modern instrumentation, and information-measurement systems. A student has to demonstrate such learning outcomes on the discipline:
• comprehension of the concept of an error of a measurement and measurement uncertainty
• knowledge of common error sources and their classification
• knowledge of methods of systematic and random error reduction
• comprehension of measurement channel concept
• knowledge of typical types of measurement sensors and instruments

1. Basic concepts of metrology.
Fundamental, applied and legal metrology. Traceability. Quantities and units.
2. Accuracy, repeatability and precision.
3. Errors representation.
Absolute, relative and reduced error.
4. Errors classification.
Random and systematic errors. Additive, multiplicative errors, and nonlinearity.
5. Systematic error cancellation.
Method of substitution. Sign compensation. Error contraposition. Gauss double weighting. Calibration.
6. Statistical approach to metrology. Uncertainty. Error distribution function. Confidence interval.
7. Components of measuring channel.
Sensors, transducers, measures.
8. Analog to digital converters.
Quantization and discretization. Nyquist–Shannon sampling theorem. Under- and oversampling. ADC types and properties.
9. Typical sensors: current, temperature, force sensors. Current shunts, Hall current sensors, current clamps, RTD, thermistors, thermocouples, IC temperature sensors, strain gages.
10. Light sensors: photoresistors, photodiodes, CCD and CMOS sensors
11. Smart sensors.
12. Measurement of electrical quantities. Voltmeters, ammeters, ohmmeters, LC-meters.
13. Oscilloscopes
14. Spectrum analyzers

1. Quantities and units
2. Errors calculations. Measurement result representation
3. Systematic error cancellation
4. Histogram plotting.
5. ADC and aliasing effects.
6. ADC error budget calculation
7. Analog to digital conversion. Measuring channel calibration
8. Measurement of electrical quantities
9. Use of oscilloscope
10. Use of spectrum analyzers

1. CGM 200:2012 International vocabulary of metrology – Basic and general concepts and associated terms (VIM) 3rd edition., CGM 2012
2. The International System of Units, Organisation Intergouvernementale de la Convention du Mètre, 2006
3. Metrology in Industry: The Key for Quality / edited by French College of Metrology, ISTE Ltd, 2006. ISBN-13: 978-1-905209-51-4
4. The Physics of Metrology - All About Instruments - A. Hebra (Springer, 2010)
5. JCGM 100:2008 Evaluation of measurement data — Guide to the expression of uncertainty in measurement, CGM 2012
6. JCGM 106:2012 Evaluation of measurement data – The role of measurement uncertainty in conformity assessment